Seongnam, South Korea

Jung Myung Kim

This inventor holds 1 USPTO granted patent. Top assignees: Line Corporation, Naver Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jung Myung Kim. Retrieved from https://idiyas.com/inventor/jung-myung-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Jung Myung Kim: Innovator in Sound Data Collection

Introduction

Jung Myung Kim is a notable inventor based in Seongnam-si, South Korea. He has made significant contributions to the field of sound data collection, particularly through his innovative patent.

Latest Patents

Jung Myung Kim holds a patent for a "Data collecting method and system." This invention involves a method of determining a highlight section of a sound source. It includes obtaining a sound source and classification information, and learning a neural network using both elements. The neural network consists of an input layer, an output layer, and a hidden layer, with functions that utilize an attention model to calculate a weighted sum of feature values. The highlight section is determined based on weight information from the feature value nodes.

Career Highlights

Throughout his career, Jung Myung Kim has worked with prominent companies such as Naver Corporation and Line Corporation. His experience in these organizations has contributed to his expertise in sound data technologies.

Collaborations

Jung Myung Kim has collaborated with talented individuals, including Jung Woo Ha and Jang Yeon Park. Their teamwork has likely enhanced the development of innovative solutions in their respective fields.

Conclusion

Jung Myung Kim's contributions to sound data collection through his patent demonstrate his innovative spirit and technical expertise. His work continues to influence advancements in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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