Yongin, South Korea

Jung-Mo Kim

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jung-Mo Kim. Retrieved from https://idiyas.com/inventor/jung-mo-kim-mq79b72n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Jung-Mo Kim: Inventor in Biometric Sensing

Introduction

Jung-Mo Kim is an inventor based in Yongin, South Korea. His patent work concerns electronic devices that use light and sensors to obtain biometric information. He is associated with Samsung Electronics Co., Ltd.

Latest Patents

The provided information lists one patent for Jung-Mo Kim: “Method for Obtaining Biometric Information Using Light Source Corresponding to Biometric Information and Electronic Device Thereof.” The invention describes an electronic device with a display, sensors, and a processor. The processor identifies different types of biometric information, uses corresponding pixel sets to output light with specified properties, and obtains the biometric information through the sensors. The record lists 1 patent.

Career Highlights

Kim’s listed invention focuses on coordinating display light and sensor operation to collect biometric information from an external object. This approach integrates display components and sensing functions within an electronic device.

Collaborations

The provided information names Jin-Hee Won and Daehyeong Lim as Kim’s coworkers. The patent is associated with Samsung Electronics Co., Ltd.

Conclusion

Jung-Mo Kim’s listed patent reflects work on integrating light-based display functions with biometric sensing in electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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