This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Fih (Hong Kong) Limited, Shenzhen Futaihong Precision Industry Co., Ltd.. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: Jung-Chen Liang: Innovator in Cross-Cut Testing Technology
Introduction
Jung-Chen Liang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of testing technology, particularly with his innovative cross-cut tester. His work has been recognized for its efficiency and cost-effectiveness in drawing lines.
Latest Patents
Jung-Chen Liang holds a patent for a cross-cut tester, which includes a handle with a receiving cavity and a plurality of blades received in that cavity. One end of the handle defines an opening, and the cross-cut tester further includes a plurality of gaskets received in the receiving cavity. The gaskets and blades are positioned one-by-one and are detachably fixed in the receiving cavity. This design effectively improves the efficiency of drawing lines and reduces costs, showcasing his inventive prowess. He has 1 patent to his name.
Career Highlights
Throughout his career, Jung-Chen Liang has worked with several companies, including Fih (Hong Kong) Limited and Shenzhen Futaihong Precision Industry Co., Ltd. His experience in these organizations has contributed to his development as an inventor and innovator in the industry.
Collaborations
Jung-Chen Liang has collaborated with notable individuals such as Guo-Zeng Zheng and Jun-Wu Hu. These partnerships have likely enriched his work and expanded his innovative capabilities.
Conclusion
Jung-Chen Liang is a distinguished inventor whose contributions to testing technology have made a significant impact. His innovative cross-cut tester exemplifies his commitment to improving efficiency and reducing costs in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile