Seoul, South Korea

Jung-Baek Ha

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jung-Baek Ha. Retrieved from https://idiyas.com/inventor/jung-baek-ha

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Jung-Baek Ha: Innovator in Communication Systems

Introduction

Jung-Baek Ha is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of communication systems, particularly through his innovative patent that enhances data transmission and reception among devices.

Latest Patents

Jung-Baek Ha holds a patent titled "Method and apparatus for controlling transmission and reception of data among plurality of devices in communication system." This patent outlines a method for controlling the transmission and reception of data among multiple devices in a communication system. The process involves enabling a master device to determine a channel assigned to each slave device connected in series, and transferring channel information to the respective slave devices. He has 1 patent to his name.

Career Highlights

Jung-Baek Ha is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His work at Samsung has allowed him to be at the forefront of technological advancements in communication systems.

Collaborations

One of his notable coworkers is Ho-jun Lee, with whom he has likely collaborated on various projects within the company.

Conclusion

Jung-Baek Ha's innovative work in communication systems exemplifies the impact of inventors in advancing technology. His contributions continue to shape the way devices communicate and interact in modern systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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