Kaohsiung, Taiwan

Jung-An Cheng

This inventor holds 1 USPTO granted patent. Top assignee: Sipix Technology, Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jung-An Cheng. Retrieved from https://idiyas.com/inventor/jung-an-cheng-ktnem6sd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Jung-An Cheng

Introduction

Jung-An Cheng is a notable inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of display technology. With a focus on enhancing the performance of display mediums, Cheng has developed innovative solutions that address key challenges in the industry.

Latest Patents

Cheng holds a patent for a display technology that includes a display medium layer and a dielectric layer. The dielectric layer is designed to decrease electric resistivity and stabilize the electric performance of the display. This innovation is crucial for improving the overall functionality and reliability of display devices.

Career Highlights

Cheng is currently employed at Sipix Technology, Inc., where he continues to work on advancing display technologies. His expertise and dedication to innovation have positioned him as a valuable asset in his field.

Collaborations

Cheng has collaborated with talented individuals such as Cheng-Yuan Lai and Hui Chen. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Jung-An Cheng's contributions to display technology exemplify the impact of innovative thinking in the industry. His patent and ongoing work at Sipix Technology, Inc. highlight his commitment to enhancing display performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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