Tokyo, Japan

Jun Umemura

This inventor holds 5 USPTO granted patents, plus 1 CIPO patent and 3 EPO patents. Top assignees: Nippon Steel Sumitomo Metal Corporation, Nippon Steel Corporation. Active years: 2018-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Umemura. Retrieved from https://idiyas.com/inventor/jun-umemura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


 

Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2018-2019

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5 patents (USPTO):Explore Patents

Title: Jun Umemura: Inventor in Measurement and Imaging Technologies.

Introduction

Jun Umemura is an inventor associated with measurement and imaging technologies. The provided information lists Tokyo, Japan, as his location and credits him with 5 patents.

Latest Patents

Umemura’s listed recent patents include “Surface Property Indexing Apparatus, Surface Property Indexing Method, and Program.” The invention uses captured images taken at different reflection angles to create processing images that support indexing the surface properties of a measured object.

Another listed patent is “Shape Measurement Apparatus and Shape Measurement Method.” It describes a light-section measurement system that calculates the distance between a camera and an object, adjusts focus based on that distance, and computes the object’s shape. The approach is intended to maintain precise measurements when the distance to the object changes.

Career Highlights

The supplied career information associates Umemura with Nippon Steel & Sumitomo Metal Corporation and Nippon Steel Corporation. His listed patent work focuses on surface analysis and shape measurement.

Collaborations

The provided information names Toshio Akagi and Hironao Yamaji as coworkers. It does not specify their roles in the listed inventions.

Conclusion

Jun Umemura’s listed patents address practical measurement challenges through image-based surface indexing and shape measurement, reflecting a focus on precision in industrial inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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