Soka, Japan

Jun Takeda

This inventor holds 1 USPTO granted patent. Top assignee: Kowa Company Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Takeda. Retrieved from https://idiyas.com/inventor/jun-takeda-lm5l5yjc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jun Takeda - Innovator in Three-Dimensional Measurement Technology.

Introduction

Jun Takeda is a notable inventor based in Soka, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to three-dimensional measurement devices. His work emphasizes accuracy and efficiency, which are crucial in various applications.

Latest Patents

Takeda holds a patent for a three-dimensional measurement device. This device is designed to perform high-accuracy three-dimensional measurements of objects. The technology involves generating a dot pattern through a series of processes, including determining a reference position using a Poisson disk sampling algorithm, selecting arrangement patterns, and iteratively arranging dots. The device projects light onto the object and captures images from two directions to calculate parallax information, ultimately specifying the three-dimensional shape of the object.

Career Highlights

Jun Takeda is associated with Kowa Company Limited, where he applies his expertise in measurement technology. His role at Kowa has allowed him to further develop and refine his inventions, contributing to the company's reputation for innovation in the field.

Collaborations

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Conclusion

Jun Takeda's work in three-dimensional measurement technology showcases his innovative spirit and dedication to precision. His contributions continue to influence the industry and pave the way for future advancements in measurement devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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