Kusatsu, Japan

Jun Shimizu

This inventor holds 1 USPTO granted patent. Top assignee: Nec Machinery Corporation. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Shimizu. Retrieved from https://idiyas.com/inventor/jun-shimizu-gubtq0dt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Jun Shimizu: Innovator in IC Test Systems

Introduction

Jun Shimizu is a prominent inventor based in Kusatsu, Japan. She has made significant contributions to the field of integrated circuit (IC) testing. With a focus on innovation, she has developed technologies that enhance the efficiency and accuracy of testing IC packages.

Latest Patents

One of her notable patents is an IC test system designed for testing ball grid array (BGA) packages. This system includes a socket with multiple contact pins, a positioning member for accurately placing the IC package, and a carriage arm that transfers the positioned package to the socket. The design ensures that vibration from the carriage arm is effectively managed, allowing for precise alignment of the IC package with the socket. Jun Shimizu holds 1 patent for this innovative technology.

Career Highlights

Jun Shimizu is currently employed at NEC Machinery Corporation, where she continues to work on advancing IC testing technologies. Her role at the company allows her to apply her expertise in developing solutions that meet the demands of modern electronics.

Collaborations

Due to space constraints, the details of her collaborations will not be included.

Conclusion

Jun Shimizu's contributions to the field of IC testing exemplify her commitment to innovation and excellence. Her work continues to impact the industry positively, paving the way for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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