Company Filing History:
Years Active: 2018
Title: Innovations by Jun Qian in Precision Surface Measurement
Introduction
Jun Qian is an accomplished inventor based in Lemont, Illinois, recognized for his significant contributions to the field of precision surface measurement. He holds a patent that showcases innovative methods and equipment designed to enhance dynamic on-axis in-situ interferometry. Qian's work is noteworthy not only for its technical sophistication but also for its practical applications in a variety of scientific disciplines.
Latest Patents
Jun Qian's patent pertains to "Precision surface measurement in a vacuum." This invention includes methods and related equipment that facilitate dynamic on-axis in-situ interferometry, where the reference surface is positioned within a vacuum chamber. The design employs wavelength shifting or phase shifting interferometers, allowing for an advanced approach that eliminates the need to physically step the cavity length with the reference surface, thereby enabling the reference surface to be placed inside the vacuum chamber.
Career Highlights
Qian is a key contributor at the prestigious UChicago Argonne, LLC, where he applies his expertise in developing innovative measurement systems. His work continues to push the boundaries of what is possible in precision measurement technologies, making him a valuable asset in research and development.
Collaborations
Throughout his career, Jun Qian has collaborated with several esteemed colleagues, including Raymond P. Conley and Mark J. Erdmann. These collaborations highlight the importance of teamwork in advancing technology and fostering a culture of innovation within the research community.
Conclusion
Jun Qian’s dedication to innovation in precision surface measurement underscores the vital role of inventors in our technological landscape. His patent not only represents a significant technical achievement but also opens up new avenues for research and application in a variety of fields. With the continued efforts of inventors like Qian, the future of precision metrology looks promising.