Osaka, Japan

Jun Nakagawa

This inventor holds 1 USPTO granted patent. Top assignee: Nec Home Electronics, Inc.. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Nakagawa. Retrieved from https://idiyas.com/inventor/jun-nakagawa-9xswsv97

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Innovations by Jun Nakagawa

Jun Nakagawa is an accomplished inventor based in Osaka, Japan. He is known for his contributions to the field of electronic appliances, particularly through his innovative patent.

Latest Patents

One of Jun Nakagawa's notable patents is a function inspecting system. This system features a plurality of inspection units designed to inspect the operation of electronic appliances. The system includes traversers that convey the electronic appliance to different inspection units, allowing for a comprehensive evaluation of various functions. The traversers are controlled by a dedicated controller, and in preferred embodiments, the electronic appliance is a printed circuit board. This invention showcases Nakagawa's commitment to enhancing the functionality and reliability of electronic devices.

Career Highlights

Jun Nakagawa is currently employed at NEC Home Electronics, Inc., where he continues to innovate and develop new technologies. His work at NEC has positioned him as a key player in the advancement of electronic appliance inspection systems.

Collaborations

Some of his coworkers include Mitsuo Ohashi and Kuniyoshi Takahashi, who contribute to the collaborative environment that fosters innovation at NEC.

Conclusion

In summary, Jun Nakagawa's work in developing a function inspecting system highlights his significant contributions to the field of electronic appliances. His innovative approach continues to influence the industry and improve the quality of electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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