Chiba, Japan

Jun Miyanoiri

This inventor holds 2 USPTO granted patents. Top assignee: Seiko Instruments Inc. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Miyanoiri. Retrieved from https://idiyas.com/inventor/jun-miyanoiri

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.7

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2013

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2 patents (USPTO):Explore Patents

Title: Innovations of Jun Miyanoiri

Introduction

Jun Miyanoiri is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of electrical engineering, particularly in power supply technologies. With a total of 2 patents to his name, his work reflects a commitment to innovation and efficiency.

Latest Patents

Miyanoiri's latest patents include a voltage application time period measuring circuit and a power supply apparatus that incorporates this circuit. This innovative measuring circuit does not require a battery, which reduces costs and enhances efficiency. Additionally, he has developed a power supply switching circuit that minimizes circuit scale while effectively managing power supply voltages.

Career Highlights

Miyanoiri is currently employed at Seiko Instruments Inc., where he continues to push the boundaries of technology. His work has been instrumental in developing solutions that address common challenges in power supply systems.

Collaborations

Some of his coworkers include Teruyuki Iwashima and Shinichi Idomukai, who contribute to the collaborative environment that fosters innovation at Seiko Instruments Inc.

Conclusion

Jun Miyanoiri's contributions to electrical engineering through his patents demonstrate his innovative spirit and dedication to improving power supply technologies. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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