Hunan, China

Jun Lei

This inventor holds 1 USPTO granted patent. Top assignee: National University of Defense Technology. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Lei. Retrieved from https://idiyas.com/inventor/jun-lei-n85uni9h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Jun Lei - Innovator in Camouflaged Object Detection

Introduction

Jun Lei is a prominent inventor based in Hunan, China. He has made significant contributions to the field of camouflaged object detection through his innovative patent. His work focuses on enhancing the capabilities of detection systems, which is crucial in various applications.

Latest Patents

Jun Lei holds a patent titled "Counterfactual context-aware texture learning for camouflaged object detection." This patent describes a sophisticated network system that includes a camera for capturing input images, a processor for performing detection, and a memory for storing essential modules. The system is designed to execute program instructions that enable the extraction of features and identification of camouflaged objects through advanced techniques.

Career Highlights

Jun Lei is affiliated with the National University of Defense Technology, where he applies his expertise in developing cutting-edge technologies. His work has garnered attention for its innovative approach to solving complex problems in object detection.

Collaborations

He collaborates with notable colleagues, including Boliang Sun and Miaomiao Yu, who contribute to his research and development efforts.

Conclusion

Jun Lei's contributions to the field of camouflaged object detection exemplify the impact of innovative thinking in technology. His patent and ongoing work continue to push the boundaries of what is possible in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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