Tokyo, Japan

Jun-ichi Ishibashi


Average Co-Inventor Count = 6.9

ph-index = 2

Forward Citations = 50(Granted Patents)


Company Filing History:


Years Active: 1989-1999

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2 patents (USPTO):Explore Patents

Title: Innovations by Jun-ichi Ishibashi

Introduction

Jun-ichi Ishibashi is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology and ultrasonic microscopy. With a total of 2 patents, his work reflects a commitment to advancing technological capabilities.

Latest Patents

Ishibashi's latest patents include a semiconductor module having an antenna element therein. This innovative module features a compact antenna capable of providing desired directivity. The design incorporates an electromagnetic-wave radiation window with lens capabilities, allowing for arbitrary directivity settings. To enhance directivity, a convergent lens is utilized for converging millimeter waves or quasi-millimeter waves. Conversely, a divergent lens is employed to impair directivity. In the case of the convergent lens, the direction of radio wave radiation or reception can be adjusted by deviating the lens's center axis from that of the antenna element. Another significant patent is the ultrasonic microscope, which showcases his expertise in advanced imaging technologies.

Career Highlights

Throughout his career, Ishibashi has worked with prominent companies such as Olympus Optical Company, Ltd. and Fujitsu Corporation. His experience in these organizations has contributed to his innovative approach and understanding of complex technologies.

Collaborations

Ishibashi has collaborated with notable individuals in the field, including Jun Fukaya and Yoshio Aoki. These partnerships have likely enriched his work and led to further advancements in his inventions.

Conclusion

Jun-ichi Ishibashi's contributions to semiconductor technology and ultrasonic microscopy highlight his innovative spirit and dedication to advancing technology. His patents reflect a deep understanding of the complexities involved in these fields.

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