Jun-ichi Hinata

Title: Jun-ichi Hinata: Innovator in Logic Circuit Testing

Introduction

Jun-ichi Hinata is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of logic circuit testing, showcasing his expertise through innovative patent developments. His work is particularly recognized for enhancing the efficiency and accuracy of testing logic circuits.

Latest Patents

Hinata holds a patent for a "Logic Circuit Testing Apparatus." This improved apparatus is designed for testing logic circuits by implementing scan-in/scan-out operations. The apparatus features input terminals that receive control signals and data signals. It includes one or more shift-paths composed of shift registers and control means that enable a bidirectional shift operation. The control means adjusts the shift direction based on the control signals from the input terminals. This innovation allows for the identification of failing shift registers within a shift-path by utilizing the bidirectional shift of logical data.

Career Highlights

Hinata is associated with Mitsubishi Denki Kabushiki Kaisha, a prominent company in the electronics and technology sector. His work there has been instrumental in advancing testing methodologies for logic circuits. His dedication to innovation has positioned him as a key figure in his field.

Collaborations

Hinata collaborates with Souichi Kobayashi, a talented woman in the same field. Their partnership exemplifies the importance of teamwork in driving technological advancements.

Conclusion

Jun-ichi Hinata's contributions to logic circuit testing through his innovative patent demonstrate his commitment to enhancing technology. His work continues to influence the industry and pave the way for future advancements.