The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1991
Filed:
May. 28, 1987
Souichi Kobayashi, Hyogo, JP;
Jun-ichi Hinata, Hyogo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
An improved apparatus for testing logic circuits by implementing scan-in/scan-out operations. The improved testing apparatus is provided with input terminals for receiving control signals and data signals, one or more shift-paths each of which is made up of shift registers and control means for enabling a bidirectional shift operation of the shift-paths and for controlling the directions in which the respective shift-paths shift logical values stored in the shift registers thereof. The control means sets the shift direction in accordance with the control signals provided from the input terminals. Thereby, if there is a failing shift register in a shift-path, the failing shift register can be located by implementing the scan-in/scan-out operation utilizing the bidirectional shift of the logical data in the shift-path.