Seongnam, South Korea

Jun-Hyub Park

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Korea Institute of Machinery & Materials. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun-Hyub Park. Retrieved from https://idiyas.com/inventor/jun-hyub-park-oyn2t7r2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Jun-Hyub Park: Innovator in Probe Card Technology

Introduction

Jun-Hyub Park is a notable inventor based in Seongnam, South Korea. He has made significant contributions to the field of machinery and materials, particularly through his innovative work on probe cards.

Latest Patents

Jun-Hyub Park holds a patent for a "Probe card and manufacturing method thereof." This invention includes a probe card that consists of multiple unit plates featuring pad areas and contact probe areas. The design incorporates a variety of electrode pads formed in the pad areas and contact probes in the contact probe areas. Additionally, the unit plates are arranged and laminated in such a way as to expose all the pad areas of each unit plate, enhancing the functionality of the probe card.

Career Highlights

Park is affiliated with the Korea Institute of Machinery & Materials, where he continues to advance his research and development efforts. His work has been instrumental in improving the efficiency and effectiveness of probe card technology.

Collaborations

Some of his notable coworkers include Jung Yup Kim and Hak Joo Lee, who have collaborated with him on various projects within the institute.

Conclusion

Jun-Hyub Park's contributions to probe card technology exemplify his innovative spirit and dedication to advancing the field of machinery and materials. His patent reflects a significant step forward in the design and functionality of probe cards, showcasing his expertise and commitment to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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