Daejeon, South Korea

Jun Ho Heo

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Lx Semicon Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Ho Heo. Retrieved from https://idiyas.com/inventor/jun-ho-heo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Jun Ho Heo in Image Data Processing

Introduction

Jun Ho Heo is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of image data processing, particularly in applications for vehicles. His innovative work reflects a deep understanding of how technology can enhance automotive systems.

Latest Patents

Jun Ho Heo holds a patent for an "Image Data Processing System for Vehicle." This patent describes a system that compensates image data by reflecting ambient illumination, thereby improving the quality and accuracy of image processing in vehicles. This innovation is crucial for enhancing safety and functionality in modern automotive technology.

Career Highlights

He is currently associated with Lx Semicon Co., Ltd., where he continues to develop cutting-edge technologies. His work at Lx Semicon has positioned him as a key player in the advancement of image processing systems.

Collaborations

Jun Ho Heo collaborates with talented individuals such as Seung Wan Yu and Ji Won Lee. Their combined expertise fosters a creative environment that drives innovation in their projects.

Conclusion

Jun Ho Heo's contributions to image data processing exemplify the impact of innovative thinking in the automotive industry. His patent and ongoing work at Lx Semicon Co., Ltd. highlight the importance of technology in enhancing vehicle safety and performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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