Chino, Japan

Jun Hakoda

This inventor holds 2 USPTO granted patents. Top assignees: Chinon Industries, Inc., Optex Co., Inc.. Active years: 2004-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Hakoda. Retrieved from https://idiyas.com/inventor/jun-hakoda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2004-2005

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Jun Hakoda: Innovator in Monitoring Technology

Introduction

Jun Hakoda is a notable inventor based in Chino, Japan. He has made significant contributions to the field of monitoring technology, holding a total of 2 patents. His innovative designs have enhanced the functionality and efficiency of surveillance systems.

Latest Patents

Hakoda's latest patents include a "Cradle for Supporting a Monitoring Camera" and a "Monitoring Camera Device Equipped with a Surveillance Sensor." These inventions reflect his commitment to improving monitoring solutions and addressing the needs of modern surveillance.

Career Highlights

Throughout his career, Jun Hakoda has worked with reputable companies such as Optex Co., Inc. and Chinon Industries, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in monitoring technology.

Collaborations

Hakoda has collaborated with talented individuals in the industry, including Yasuhiko Matsumoto and Kazutaka Sakamoto. These partnerships have fostered a creative environment that has led to the development of groundbreaking inventions.

Conclusion

Jun Hakoda's contributions to monitoring technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the field positively, paving the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…