Yongin, South Korea

Jun-Haeng Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun-Haeng Lee. Retrieved from https://idiyas.com/inventor/jun-haeng-lee-equx6nfe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Jun-Haeng Lee: Innovator in Motion Recognition Technology

Introduction

Jun-Haeng Lee is a prominent inventor based in Yongin, South Korea. He has made significant contributions to the field of motion recognition technology. His innovative work focuses on utilizing event-based vision sensors to enhance motion detection capabilities.

Latest Patents

Jun-Haeng Lee holds a patent for an "Apparatus and method for recognizing motion by using an event-based vision sensor." This invention provides a comprehensive solution for recognizing motion through a vision sensor that detects movement and outputs events. The apparatus includes a movement type determiner, two motion determiners, and a motion controller, all working together to accurately track and control movement.

Career Highlights

Lee is currently employed at Samsung Electronics Co., Ltd., where he continues to develop cutting-edge technologies. His work has positioned him as a key player in the advancement of motion recognition systems.

Collaborations

He has collaborated with notable colleagues, including Hyun-Surk Ryu and Keun-Joo Park, to further enhance the capabilities of their projects.

Conclusion

Jun-Haeng Lee's innovative contributions to motion recognition technology demonstrate his expertise and commitment to advancing the field. His patent reflects a significant step forward in utilizing event-based vision sensors for motion detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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