Tel Aviv, Israel

Jun Furukawa

This inventor holds 1 USPTO granted patent. Top assignees: Bar-Ilan University, Nec Corporation, Nec Corporation of America. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Furukawa. Retrieved from https://idiyas.com/inventor/jun-furukawa-5qs6186y

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Jun Furukawa

Introduction

Jun Furukawa is an accomplished inventor based in Tel Aviv, Israel. He has made significant contributions to the field of secure statistical classifiers, showcasing his expertise through his innovative patent.

Latest Patents

Furukawa holds a patent for "Systems and methods for generating and applying a secure statistical classifier." This patent describes a system that utilizes hardware processors to compute a secure statistical classifier. The system involves accessing code instructions of an untrained statistical classifier, a training dataset, and a plurality of cryptographic keys. It creates trained sub-classifiers by iteratively adjusting classification parameters based on training data and corresponding ground truth labels. The unique aspect of this invention is that each trained sub-classifier has adjustable parameters computed according to unique cryptographic keys. This innovation enhances the security and effectiveness of statistical classification.

Career Highlights

Throughout his career, Jun Furukawa has worked with notable organizations, including NEC Corporation of America and Bar-Ilan University. His experiences in these institutions have contributed to his development as a leading inventor in his field.

Collaborations

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Conclusion

Jun Furukawa's contributions to the field of secure statistical classifiers highlight his innovative spirit and technical expertise. His patent reflects a significant advancement in the application of cryptographic methods in statistical analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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