Tokyo, Japan

Jun Akimitsu

This inventor holds 3 USPTO granted patents. Top assignee: Canon Kabushiki Kaisha. Active years: 1991-1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Akimitsu. Retrieved from https://idiyas.com/inventor/jun-akimitsu-f3w7fj6e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 3

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 1991-1996

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3 patents (USPTO):Explore Patents

Title: Jun Akimitsu: Innovator in Metal Oxide Materials

Introduction

Jun Akimitsu is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of materials science, particularly in the development of metal oxide materials. With a total of 3 patents to his name, Akimitsu continues to push the boundaries of innovation in his field.

Latest Patents

A notable patent by Akimitsu is focused on a metal oxide material and the method of manufacturing it. This innovative material comprises components expressed by a specific composition formula. Another significant patent involves substituted superconductive Bi-Sr-Ca-Cu oxide and Bi-Sr-Ca-Ln-Cu oxide, which represents a breakthrough in metal oxide technology.

Career Highlights

Jun Akimitsu is currently employed at Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to explore advanced materials that have applications in various technologies.

Collaborations

Throughout his career, Akimitsu has collaborated with notable colleagues, including Tohru Den and Norio Kaneko. These partnerships have fostered a creative environment that enhances innovation and research.

Conclusion

Jun Akimitsu's contributions to the field of metal oxide materials exemplify his dedication to innovation. His patents reflect a commitment to advancing technology and improving material properties.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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