This inventor holds 3 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 1992-1993.
Company Filing History:
Years Active: 1992-1993
Title: Innovations by Julius J Lambright
Introduction
Julius J Lambright is a notable inventor based in Hopewell Junction, NY (US). He has made significant contributions to the field of object inspection technology. With a total of 3 patents to his name, Lambright's work focuses on advanced methods for detecting surface level defects.
Latest Patents
Lambright's latest patents include a method and apparatus for object inspection. This innovative technology involves positioning the object to be inspected and utilizing polarized laser light reflected off a rotated polygon mirror. The light is directed over the area of interest, while a plurality of fiber optic bundles receive and conduct the reflected light back to photomultipliers. These photomultipliers convert the light into electrical signals, which are then digitized by associated electronics. By tracking pixel edge boundaries and assessing whether certain thresholds are exceeded, the area can be checked for various defects. This method allows for the categorization of defects by comparing them to a reference base.
Another significant patent is the Advanced via inspection tool (AVIT), which employs a similar methodology for inspecting surface level defects. The process remains consistent, utilizing polarized laser light and fiber optic technology to ensure accurate detection and categorization of defects.
Career Highlights
Julius J Lambright is currently employed at International Business Machines Corporation (IBM). His work at IBM has allowed him to develop and refine his innovative inspection technologies, contributing to advancements in the field.
Collaborations
Lambright has collaborated with notable coworkers, including Stephen J Kish and Kenneth A Bird. Their combined expertise has likely enhanced the development of Lambright's innovative technologies.
Conclusion
Julius J Lambright's contributions to object inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in detecting surface level defects, making significant strides in the industry.