Kista, Sweden

Julius Hållstedt

This inventor holds 1 USPTO granted patent and 1 published patent application and 2 EPO patents. Top assignee: Excillum Ab. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Julius Hållstedt. Retrieved from https://idiyas.com/inventor/julius-hållstedt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Julius Hållstedt - Innovator in X-Ray Imaging Technology.

Introduction: Julius Hållstedt is an inventor based in Kista, Sweden, known for his contributions to the field of X-ray imaging technology. He currently works at Excillum AB, where he collaborates with fellow innovators Ulf Lundström and Per Takman. Although he has not yet been granted any patents, his work is significant in advancing imaging systems.

Latest Patent Applications: One of Julius Hållstedt's notable patent applications is for an X-ray imaging system. This system includes a target and an electron beam source configured to provide an electron beam for interaction with the target to generate X-ray radiation. The design features electron optics that alternately direct the electron beam to at least a first and a second location on the target. Additionally, it incorporates an X-ray detector array that receives X-ray radiation generated at these locations. The system also includes a sample position region for receiving a sample to be exposed to the generated X-ray radiation, where the radiation from both locations overlaps. A processing unit is coupled to the X-ray detector array, which is configured to create an image of the sample based on the X-ray radiation from both locations.

Conclusion: Julius Hållstedt's innovative work in X-ray imaging technology showcases his potential as an inventor in the field. His contributions, particularly through his patent application, highlight the importance of advancements in imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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