Torrance, CA, United States of America

Juliet N Schurr

This inventor holds 1 USPTO granted patent. Top assignee: The Aerospace Corporation. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Juliet N Schurr. Retrieved from https://idiyas.com/inventor/juliet-n-schurr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Juliet N. Schurr: Ultrasonic Measurement of Material Properties.

Introduction

Juliet N. Schurr is an inventor associated with The Aerospace Corporation in Torrance, California. Her patent work addresses the measurement of material properties in thin layers, where conventional testing of bulk specimens may not provide representative results.

Latest Patents

Schurr is credited with 1 patent: “Apparatus and Method for Ultrasonically Measuring the Poisson’s Ratio of [a Specimen].” The invention presents an ultrasonic resonance technique for accurately measuring Poisson’s ratio in specimens formed as thin layers less than 10 mils thick. The patent describes the theory behind the method and reports its use to measure three thin specimen materials, comparing the results with measurements from corresponding bulk specimens. It also identifies potential applications such as monitoring adhesive curing.

Career Highlights

Schurr’s patent highlights an approach to characterizing materials when a bulk sample is unavailable or would not reflect the properties of the material in its thin-layer configuration. The work connects ultrasonic measurement methods with practical materials testing.

Collaborations

Her listed coworkers include Eric C. Johnson and Jessica D. Pollchik. The patent is associated with The Aerospace Corporation.

Conclusion

Juliet N. Schurr’s patented ultrasonic technique offers a way to measure Poisson’s ratio in thin materials and points to broader uses in materials evaluation, including adhesive cure monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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