Bussy Saint Georges, France

Julien Velghe

This inventor holds 1 USPTO granted patent. Top assignee: Essilor International (Compagnie Generale D'optique). Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Julien Velghe. Retrieved from https://idiyas.com/inventor/julien-velghe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2014

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Julien Velghe

Introduction

Julien Velghe is a notable inventor based in Bussy Saint Georges, France. He has made significant contributions to the field of optical technology. His work primarily focuses on developing instruments that enhance the measurement of optical parameters.

Latest Patents

Julien Velghe holds a patent for an optical parameter measuring instrument. This invention showcases his expertise in creating tools that improve the accuracy and efficiency of optical measurements. He has 1 patent to his name, reflecting his innovative approach to solving complex problems in the optical industry.

Career Highlights

Julien Velghe is currently employed at Essilor International, a leading company in the optical sector. His role at Essilor allows him to apply his inventive skills in a practical setting, contributing to advancements in eyewear and vision care. His work at the company has positioned him as a key player in the development of new optical technologies.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Julien Velghe's contributions to optical technology through his patent and work at Essilor International highlight his role as an innovative inventor. His dedication to improving optical measurement instruments is commendable and showcases the importance of innovation in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…