This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Sensima Inspection Sàrl. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations by Julien Hubleur
Introduction
Julien Hubleur is an accomplished inventor based in Geneva, Switzerland. He has made significant contributions to the field of inspection technology, particularly with his innovative designs aimed at enhancing defect detection in various components.
Latest Patents
One of Julien Hubleur's notable inventions is a rotatable inspection device for defect detection. This device is designed to inspect the integrity of axisymmetric portions of parts, such as threaded tubes. The rotatable inspection device features a measuring unit that can be rotated about the symmetry axis of the inspected portion. It includes a radially movable measuring structure equipped with a defect detection sensor, which is configured to press against the portion being inspected. Additionally, the device incorporates an electronic unit for processing and wirelessly transmitting the measured signals to a remote monitoring unit. This innovative approach enhances the efficiency and accuracy of defect detection in various applications.
Career Highlights
Julien Hubleur is associated with Sensima Inspection Sàrl, a company that specializes in advanced inspection technologies. His work at Sensima has allowed him to develop cutting-edge solutions that address critical challenges in the inspection industry. With a focus on innovation, he continues to push the boundaries of what is possible in defect detection.
Collaborations
Julien collaborates with talented professionals in his field, including Marc Lany and Alain Berthoud. Their combined expertise contributes to the development of innovative solutions that enhance the capabilities of inspection technologies.
Conclusion
Julien Hubleur's contributions to the field of inspection technology, particularly through his rotatable inspection device, demonstrate his commitment to innovation and excellence. His work continues to impact the industry positively, paving the way for more effective defect detection solutions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile