North Yorkshire, United Kingdom

Julian Peter Attard

This inventor holds 2 USPTO granted patents. Top assignee: Dupont Teijin Films U.S. Ltd.. Active years: 2010-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Julian Peter Attard. Retrieved from https://idiyas.com/inventor/julian-peter-attard

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.9

ph-index = 2

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 2010-2013

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2 patents (USPTO):Explore Patents

Title: Innovations of Julian Peter Attard

Introduction

Julian Peter Attard is a notable inventor based in North Yorkshire, GB. He has made significant contributions to the field of polymeric films, holding 2 patents that showcase his innovative processes and materials.

Latest Patents

His latest patents include a process for the production of brittle polymeric film and tamper evident labels made therefrom. This process involves the use of a copolyester with specific acid and diol components. The steps include melt-extruding a layer of the copolyester, stretching the extrudate, and heat-setting the film under controlled temperature conditions. The resulting polymeric film exhibits an ultimate tensile strength at destruction, making it suitable for various applications.

Career Highlights

Julian works at DuPont Teijin Films U.S. Ltd., where he continues to develop innovative solutions in the polymer industry. His expertise in polymeric materials has positioned him as a key player in advancing film technology.

Collaborations

He collaborates with esteemed colleagues such as William Alasdair MacDonald and Pierre Georges Osborne Moussalli, contributing to a dynamic research environment.

Conclusion

Julian Peter Attard's work in the field of polymeric films exemplifies the spirit of innovation and dedication to advancing material science. His contributions are paving the way for future developments in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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