Manchester, United Kingdom

Julian P Davey

This inventor holds 1 USPTO granted patent. Top assignee: Kratos LLC. Active years: 1979.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Julian P Davey. Retrieved from https://idiyas.com/inventor/julian-p-davey

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1979

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1 patent (USPTO):Explore Patents

Title: The Innovations of Julian P Davey

Introduction

Julian P Davey is a notable inventor based in Manchester, GB. He has made significant contributions to the field of electron microscopy, showcasing his expertise and innovative spirit. With a focus on enhancing the functionality of electron microscopes, Davey has secured a patent that reflects his commitment to advancing technology.

Latest Patents

Julian P Davey holds a patent for an innovative design of electron microscopes. The patent describes an evacuated housing that contains an electron gun, which accelerates a beam of electrons directed into a microscopic column. An ion-stopping member is strategically placed in the accelerator to intercept ions that could interfere with the specimen. The design ensures that the electron beam is directed along a path that avoids interception, utilizing either a displacement or inclination of the gun or electron beam deflection means. This innovative approach enhances the precision and effectiveness of electron microscopy.

Career Highlights

Throughout his career, Julian P Davey has been associated with Kratos LLC, where he has contributed to the development of advanced electron microscopy technologies. His work has been instrumental in pushing the boundaries of what is possible in this field, making significant strides in the accuracy and reliability of electron microscopes.

Conclusion

Julian P Davey is a distinguished inventor whose work in electron microscopy has paved the way for advancements in the field. His patent reflects a deep understanding of the complexities involved in electron beam technology, and his contributions continue to influence the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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