Joensuu, Finland

Juho Pörhönen

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Blancco Technology Group IP Oy. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Juho Pörhönen. Retrieved from https://idiyas.com/inventor/juho-pörhönen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Juho Pörhönen: Innovator in Camera Technology

Introduction

Juho Pörhönen is a notable inventor based in Joensuu, Finland. He has made significant contributions to the field of camera technology, particularly in the area of damage detection.

Latest Patents

Pörhönen holds a patent for a system and method for determining whether a camera component is damaged. This computer-implemented method involves obtaining information related to damage indicators and analyzing images taken by the camera to assess the condition of its components. The process includes dividing the image into areas and determining if any of these areas show signs of damage, ultimately classifying the component as either damaged or undamaged.

Career Highlights

Juho Pörhönen is associated with Blancco Technology Group IP Oy, where he applies his expertise in camera technology. His innovative approach has led to advancements in ensuring the reliability of camera systems.

Collaborations

Pörhönen collaborates with colleagues such as Markku Valtonen and Lauri Lalli, contributing to a dynamic work environment that fosters innovation.

Conclusion

Juho Pörhönen's work in developing methods for assessing camera component integrity showcases his commitment to advancing technology in this field. His contributions are valuable to both the industry and consumers alike.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…