Widnau, Switzerland

Juerg Weilenmann

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Leica Geosystems Ag. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Juerg Weilenmann. Retrieved from https://idiyas.com/inventor/juerg-weilenmann

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 66(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Juerg Weilenmann: Innovator in Geomagnetic Research

Introduction

Juerg Weilenmann is a notable inventor based in Widnau, Switzerland. He has made significant contributions to the field of geomagnetism, particularly through his innovative patent. His work is recognized for its impact on understanding the earth's magnetic field.

Latest Patents

Juerg Weilenmann holds a patent for a "Process for determining the direction of the earth's magnetic field." This invention showcases his expertise and dedication to advancing technology in geomagnetic research. He has 1 patent to his name, reflecting his innovative spirit.

Career Highlights

Weilenmann is associated with Leica Geosystems AG, a company renowned for its precision measurement technology. His role at the company allows him to apply his inventive skills in a practical setting, contributing to advancements in geospatial technology.

Collaborations

One of his notable coworkers is Silvio Gnepf, with whom he collaborates on various projects. Their partnership exemplifies the importance of teamwork in driving innovation and achieving technological breakthroughs.

Conclusion

Juerg Weilenmann's contributions to geomagnetic research and his patent for determining the earth's magnetic field direction highlight his role as an influential inventor. His work continues to inspire advancements in the field of geospatial technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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