San Marcos, TX, United States of America

Jueqiang Tao

This inventor holds 1 USPTO granted patent. Top assignee: Texas State University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jueqiang Tao. Retrieved from https://idiyas.com/inventor/jueqiang-tao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jueqiang Tao: Advancing Automated Air-Void Analysis in Concrete

Introduction

Jueqiang Tao is an inventor based in San Marcos, Texas, and is associated with Texas State University. His patent work addresses automated analysis of hardened concrete, applying three-dimensional imaging and machine learning to identify air voids on a surface.

Latest Patents

Tao is credited with 1 patent: “Three-dimensional photometric reconstruction based automated air-void segmentation system for hardened concrete.” The disclosed method receives multiple images of a surface, reconstructs them into at least one three-dimensional representation, and processes that representation with an algorithm trained to identify air voids. The patent also describes a computing device and a system for carrying out this automated identification.

Career Highlights

Tao’s listed patent highlights an approach that combines photometric reconstruction with automated segmentation. By using three-dimensional surface representations and a trained identification algorithm, the invention is designed to support the analysis of air voids in hardened concrete.

Collaborations

Tao’s listed coworkers include Feng Wang and Haitao Gong. The patent information provided connects his work with Texas State University.

Conclusion

Jueqiang Tao’s patent presents a computer-implemented approach to identifying air voids in hardened concrete, bringing together three-dimensional reconstruction and automated image analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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