Seville, Spain

Juan Jose Murillo Fuentes

This inventor holds 1 USPTO granted patent. Top assignee: Vodafone Group Plc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Juan Jose Murillo Fuentes. Retrieved from https://idiyas.com/inventor/juan-jose-murillo-fuentes

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations by Juan Jose Murillo Fuentes

Introduction

Juan Jose Murillo Fuentes is a notable inventor based in Seville, Spain. He has made significant contributions to the field of wireless communication. His innovative approach has led to the development of a unique method for detecting interference in wireless communication systems.

Latest Patents

Juan Jose holds a patent for a method to determine the existence of interferences in a wireless communication link. This method involves comparing the power received at both links of a radio channel and the propagation losses calculated from both power and quality measurements. His patent is a valuable addition to the technology used in wireless communications.

Career Highlights

Juan Jose is currently employed at Vodafone Group Plc, a leading telecommunications company. His work at Vodafone has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in wireless technology.

Collaborations

He has collaborated with notable colleagues, including Guillermo Bruno Esteve Asensio and Francisco Javier Rubio Andres. These collaborations have further enriched his work and expanded the impact of his inventions.

Conclusion

Juan Jose Murillo Fuentes is a distinguished inventor whose work in wireless communication has made a significant impact. His innovative methods and collaborations continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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