Suwon, South Korea

Ju Wan Lim

This inventor holds 28 USPTO granted patents and 6 published patent applications and 11 EPO patents, primarily in Battery Charging Technology. Top assignees: Samsung Electronics Co., Ltd., Samsung Electronics Ltd.. Active years: 2018-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ju Wan Lim. Retrieved from https://idiyas.com/inventor/ju-wan-lim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 28 

% Patents Active = 96.4

 

Average Co-Inventor Count = 3.6

ph-index = 3

Forward Citations = 40(Granted Patents)


Company Filing History:


Years Active: 2018-2026

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Areas of Expertise:
Battery Charging
Short Circuit Detection
Electrochemical Model
Charge Balance
Diffusion Characteristics
Battery Monitoring
State Estimation
Temperature Management
Battery Management
Capacitive Deionization
Charging Control
Battery Path Generation
28 patents (USPTO):Explore Patents

Title: Inventor Ju Wan Lim

Introduction: Ju Wan Lim is a prolific inventor based in Suwon-si, South Korea, known for his groundbreaking innovations in various fields.

Latest Patents: Ju Wan Lim holds several patents in the areas of technology and electronics, showcasing his continuous dedication to pushing the boundaries of innovation.

Career Highlights: With a career spanning over two decades, Ju Wan Lim has established himself as a leading figure in the world of inventors, with a track record of turning revolutionary ideas into tangible products.

Collaborations: Throughout his career, Ju Wan Lim has collaborated with top research institutions, universities, and companies to bring his inventions to life, demonstrating his ability to work effectively in multidisciplinary teams.

Conclusion: Ju Wan Lim's passion for innovation, coupled with his relentless drive to create, solidifies his position as a prominent inventor making significant contributions to the world of technology and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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