Seoul, South Korea

Ju Hun Lee

This inventor holds 1 USPTO granted patent. Top assignees: Industry-University Cooperation Foundation Hanyang University, Korea University Research and Business Foundation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ju Hun Lee. Retrieved from https://idiyas.com/inventor/ju-hun-lee-yyfpv5ai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ju Hun Lee

Introduction

Ju Hun Lee is an accomplished inventor based in Seoul, South Korea. He has made significant contributions to the field of medical technology, particularly in the detection of viruses. His innovative approach has led to the development of a patent that addresses a critical health concern.

Latest Patents

Ju Hun Lee holds a patent for a "Kit and Method for Detecting Coronavirus." This invention is particularly relevant in the context of global health challenges, as it provides a reliable means of identifying the presence of the virus.

Career Highlights

Throughout his career, Ju Hun Lee has been associated with notable institutions. He has worked with the Korea University Research and Business Foundation, where he contributed to various research initiatives. Additionally, he has been involved with the Industry-University Cooperation Foundation at Hanyang University, further enhancing his expertise in innovation and research.

Collaborations

Due to space constraints, the details of his collaborations will not be included.

Conclusion

Ju Hun Lee's work exemplifies the spirit of innovation in the medical field. His patent for detecting coronavirus showcases his commitment to addressing pressing health issues through technology. His contributions are invaluable in the ongoing fight against infectious diseases.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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