Fremont, CA, United States of America

Ju Gao

This inventor holds 1 USPTO granted patent. Top assignee: Omnivision Technologies, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ju Gao. Retrieved from https://idiyas.com/inventor/ju-gao-tgrxkf1k

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Ju Gao - Innovator in Image Capture Technology

Introduction

Ju Gao is a prominent inventor based in Fremont, CA, known for his contributions to image capture systems. With a focus on enhancing the capabilities of lens units, his work has significant implications for the field of imaging technology.

Latest Patents

Ju Gao holds a patent for "Image capture systems with focusing capabilities." This invention describes a method of providing image focusing capabilities for a lens unit by disposing a solid state die over the lens unit. The solid state die includes a plurality of electrodes that receive a voltage or electric signal to generate an electric field. This electric field alters the refractive index of the solid state die, allowing it to focus the image or scene captured by the lens unit.

Career Highlights

Ju Gao is currently employed at OmniVision Technologies, Inc., where he continues to innovate in the field of imaging technology. His work has led to advancements that improve the quality and functionality of image capture systems.

Collaborations

Some of his notable coworkers include Zheng Du and Denis Chu, who contribute to the collaborative environment at OmniVision Technologies, Inc.

Conclusion

Ju Gao's innovative work in image capture technology exemplifies the impact of modern inventions on everyday life. His patent for focusing capabilities in image capture systems showcases his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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