Meerssen, Netherlands

Jozef H Neven

This inventor holds 1 USPTO granted patent. Top assignee: Rheometron Ag. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jozef H Neven. Retrieved from https://idiyas.com/inventor/jozef-h-neven

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1987

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jozef H Neven: Innovator in Magnetic-Inductive Flow Measurement

Introduction

Jozef H Neven is a notable inventor based in Meerssen, Netherlands. He has made significant contributions to the field of flow measurement technology. His innovative work has led to the development of a patented sensor that enhances the functionality of magnetic-inductive flowmeters.

Latest Patents

Jozef H Neven holds a patent for a "Sensor for magnetic-inductive flowmeters." This invention represents a crucial advancement in the measurement of fluid flow, providing improved accuracy and reliability in various applications.

Career Highlights

Neven is currently associated with Rheometron AG, a company known for its expertise in flow measurement technology. His role at Rheometron AG allows him to apply his innovative ideas and contribute to the advancement of the industry.

Collaborations

Throughout his career, Jozef has collaborated with talented individuals such as Boodewijn J Poortman and Wouter T Tromp. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Jozef H Neven's contributions to the field of flow measurement through his patented innovations highlight his role as a key figure in the industry. His work continues to influence advancements in technology and improve measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…