This inventor holds 1 USPTO granted patent. Top assignee: Sandia Corporation. Active years: 2015.
Company Filing History:
Years Active: 2015
Title: Jovana Helms: Innovator in Electron and Scanning Probe Microscopy
Introduction
Jovana Helms is a prominent inventor based in Dublin, California. She has made significant contributions to the field of microscopy, particularly in the development of systems and methods for electron and scanning probe microscopy. Her innovative approach has led to advancements that enhance imaging techniques in scientific research.
Latest Patents
Jovana holds a patent for "Sparse sampling and reconstruction for electron and scanning probe microscope imaging." This patent outlines systems and methods for conducting electron or scanning probe microscopy with an undersampled data set. The process involves driving an electron beam or probe to scan across a sample, visiting a subset of pixel locations that are randomly or pseudo-randomly designated. The data collected from these visits is then processed to recover a reconstructed image of the sample.
Career Highlights
Jovana is currently employed at Sandia Corporation, where she continues to push the boundaries of microscopy technology. Her work has been instrumental in improving the efficiency and accuracy of imaging techniques used in various scientific applications.
Collaborations
Jovana collaborates with talented individuals such as Hyrum Anderson and Jason W Wheeler, contributing to a dynamic team focused on advancing microscopy technologies.
Conclusion
Jovana Helms is a trailblazer in the field of microscopy, with her innovative patent and contributions to Sandia Corporation. Her work exemplifies the impact of creativity and collaboration in scientific research.