This inventor holds 1 USPTO granted patent. Top assignee: Nextrom Holdings S.a.. Active years: 2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2005
Title: Jouko Viitanen: Innovator in Measurement Technology
Introduction
Jouko Viitanen is a notable inventor based in Tampere, Finland. He has made significant contributions to the field of measurement technology, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of measuring the geometry of grooves in elongated elements.
Latest Patents
Jouko Viitanen holds a patent for a method of measuring the geometry of grooves in an elongated element. This invention relates to a method and arrangement for measuring continuous grooves that extend along the entire length of the element. The method involves scanning the surface of the elongated element using a camera, allowing for simple non-contact measurement. The elongated element is designed to travel through a specialized optical arrangement, which includes a biconical mirror or bevelled cone mirror. This setup enables the precise reflection of a laser beam onto the surface, facilitating the study of groove geometry.
Career Highlights
Viitanen's career is marked by his role at Nextrom Holdings S.A., where he has applied his expertise in measurement technology. His innovative approach has contributed to advancements in the industry, showcasing his commitment to improving measurement techniques.
Collaborations
Throughout his career, Jouko has collaborated with talented individuals such as Joni Leinvuo and Juha Korpinen. These collaborations have further enriched his work and contributed to the development of innovative solutions in measurement technology.
Conclusion
Jouko Viitanen's contributions to measurement technology through his patent demonstrate his innovative spirit and dedication to advancing the field. His work continues to influence the industry, paving the way for future developments in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile