Location History:
- Coral Springs, FL (US) (2004)
- St. Clair Shores, MI (US) (2009)
- Kansas City, MO (US) (2012 - 2017)
- Rochester Hills, MI (US) (2018)
Company Filing History:
Years Active: 2004-2024
Title: The Innovative Contributions of Joseph Walker
Introduction
Joseph Walker is a notable inventor based in Kansas City, MO, with a remarkable portfolio of nine patents. His work primarily focuses on developing advanced measuring instruments that enhance precision in various applications.
Latest Patents
One of his latest inventions is a coating thickness measuring instrument. This innovative device features a probe designed to measure the thickness of a coating applied to a substrate. It produces an output that relates to the measured thickness, while a memory component stores calibration data. The processor processes the output from the probe along with the calibration data to provide accurate coating thickness measurements. Notably, the memory can store multiple sets of calibration data, allowing users to select the appropriate set based on the surface profile of the substrate. This functionality enables users to measure coating thickness on substrates with different surface profiles without the need for specific calibration.
Career Highlights
Throughout his career, Joseph Walker has made significant contributions to the field of measurement technology. He has worked with reputable companies such as Fike Corporation and Elcometer, Inc., where he has applied his expertise to develop innovative solutions.
Collaborations
Joseph has collaborated with talented individuals in his field, including Bon F Shaw and Bradford T Stilwell. Their combined efforts have led to advancements in measurement technologies and have furthered the impact of their work.
Conclusion
Joseph Walker's contributions to the field of invention, particularly in coating thickness measurement, highlight his innovative spirit and dedication to precision. His patents and collaborations reflect a commitment to advancing technology in meaningful ways.