Company Filing History:
1 out of 7 
1 out of 780 
1 out of 832,680 Years Active: 1998-2011
Title: **Innovator Spotlight: Joseph T. Widunas**
Introduction
Joseph T. Widunas, an accomplished inventor based in Fremont, California, has made significant contributions to the field of optical measurement. With three patents to his name, his work focuses on innovative methods and devices for measuring reflected optical radiation, reflecting his commitment to advancing diagnostic technologies.
Latest Patents
His latest patent introduces a groundbreaking method and device for measuring reflected optical radiation. This invention features an optics assembly and a reflectometer, designed to provide quantitative measurements of optical radiation reflected from sampling areas on an assay matrix. The reflectometer integrates an optical radiation source and a detector, both mounted in a single plane, allowing for enhanced accuracy and efficiency. The optics assembly is meticulously configured to direct illumination from the source to the sampling area, subsequently capturing diffused reflected radiation and directing it to the detector. This robust invention also outlines a method for determining the presence of selected analytes in a sample, employing multiple sampling areas across one or more assay matrixes.
Career Highlights
Throughout his career, Joseph T. Widunas has collaborated with notable companies, including Metrika, Inc., contributing his expertise to various innovative projects. His work not only emphasizes practical applications but also showcases his ability to push the boundaries of existing technologies in optical measurement.
Collaborations
Joseph has had the privilege of working alongside distinguished colleagues such as Joel M. Blatt and Raymond T. Hebert. These collaborations have allowed him to share knowledge and insights, enhancing the impact of his inventions within the scientific community.
Conclusion
Joseph T. Widunas stands out as a prominent inventor in the realm of optical measurement technologies. His dedication to innovation and the development of advanced diagnostic methods demonstrates his significant contributions to the field. As he continues to build on his expertise, his future work promises to further enrich our understanding and capabilities in optical radiation measurement.
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