Company Filing History:
Years Active: 1982
Title: Joseph P. Sattler: Innovator in Rare Earth Ion Testing and Refractometry
Introduction
Joseph P. Sattler is a notable inventor based in Silver Spring, MD (US). He has made significant contributions to the fields of rare earth ion testing and refractometry. With a total of 2 patents, Sattler's work has advanced the understanding and application of semiconductor materials and rare earth ions.
Latest Patents
Sattler's latest patents include a "System and method for testing the reaction of rare earth ions" and a "Heterodyne indicial refractometer." The first patent describes a crystalline bar doped with rare earth elements, which is transparent to radiation from a laser. This bar is excited at a specific light wavelength, allowing for the measurement of phonon activity through mechanical resonance. The second patent outlines a method for accurately determining the index of refraction of semiconductor materials and other transparent materials using a continuously tuned diode laser and CO₂ laser.
Career Highlights
Joseph P. Sattler is currently employed by the US Government as represented by the Secretary of the Army. His work has been instrumental in developing innovative methods for testing and measurement in scientific applications.
Collaborations
Sattler has collaborated with notable coworkers, including Terrance L. Worchesky and Kenneth J. Ritter. Their combined expertise has contributed to the success of various projects and patents.
Conclusion
Joseph P. Sattler's contributions to the fields of rare earth ion testing and refractometry highlight his innovative spirit and dedication to advancing technology. His patents reflect a commitment to scientific progress and practical applications in the industry.