Joseph M Munoz

Title: Innovations by Joseph M. Munoz: The Probe Head for Semiconductive Wafer Probers

Introduction

Joseph M. Munoz is an accomplished inventor based in San Jose, California, recognized for his contributions to the field of semiconductor testing. With a focus on technical innovations, he has secured a patent that enhances the efficiency of automatic semiconductive wafer probers.

Latest Patents

The patent held by Joseph M. Munoz is titled “Probe Head for an Automatic Semiconductive Wafer Prober.” This invention is designed to improve the testing process of semiconductive wafers. The probe head comprises a probe body that connects to a probe holder surrounding a chuck, which carries the wafer. The design allows for both horizontal and vertical adjustments to engage multiple test points efficiently on a wafer under test. The testing head includes a probe portion, such as a blade or needle, to establish electrical contact with the test points, showcasing Munoz’s innovative approach to semiconductor technology.

Career Highlights

Joseph Munoz works at Pacific Western Systems, where his expertise and innovative spirit have significantly contributed to the company's advancements in semiconductor testing technology. Through his career, he has focused on developing tools that enhance the precision and effectiveness of wafer probing.

Collaborations

Throughout his career, Joseph has collaborated with noted colleagues such as Daniel A. Worsham and Jack E. Ashley. These partnerships have fostered an environment of innovative thinking, allowing them to push the boundaries of semiconductor testing solutions.

Conclusion

Joseph M. Munoz's patent for the probe head is a testament to his ingenuity in the semiconductor industry. His work at Pacific Western Systems and collaborations with esteemed coworkers highlight his dedication to enhancing semiconductor testing processes. The innovations brought forth by Munoz play a crucial role in advancing technology within this critical sector.