Columbia, MD, United States of America

Joseph M Comberiate

This inventor holds 1 USPTO granted patent. Top assignee: Johns Hopkins University. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joseph M Comberiate. Retrieved from https://idiyas.com/inventor/joseph-m-comberiate

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Joseph M Comberiate: Innovator in Tomographic Retrieval Systems

Introduction

Joseph M Comberiate is a notable inventor based in Columbia, MD (US). He has made significant contributions to the field of measurement systems, particularly through his innovative patent.

Latest Patents

Joseph M Comberiate holds a patent titled "System and method for tomographic retrieval of parameter profile from traveling path." This invention involves a system designed to measure a parameter of a medium using a vehicle that moves through the medium. The system includes four detecting portions that capture values of the parameter from various lines-of-sight at different positions and times. The calculating portion of the system processes these values to determine the parameter based on specific intersections of the lines-of-sight.

Career Highlights

Joseph is affiliated with Johns Hopkins University, where he applies his expertise in innovative measurement technologies. His work has contributed to advancements in the field, showcasing his commitment to research and development.

Collaborations

Throughout his career, Joseph has collaborated with esteemed colleagues, including Larry J Paxton and Michael A Kelly. These partnerships have fostered a collaborative environment that enhances innovation and research outcomes.

Conclusion

Joseph M Comberiate is a distinguished inventor whose work in tomographic retrieval systems exemplifies the intersection of technology and measurement. His contributions continue to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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