Joseph Kileel

Title: Joseph Kileel and Automated Particle Picking for Electron Microscopy.

Introduction

Joseph Kileel is an inventor associated with Princeton University in Princeton, New Jersey. His patent work addresses a key step in electron microscopy: automatically locating particle images in micrographs for use in determining three-dimensional structures.

Latest Patents

Kileel is associated with 1 patent, titled “Fully Automatic, Template-Free Particle Picking for Electron Microscopy.” The patent describes systems and methods for automatically locating and extracting two-dimensional particle projections from a micrograph without relying on preselected templates. The method analyzes partially overlapping image windows, selects reference images according to statistical criteria, and compares them with query windows using normalized cross-correlation. It then identifies locations likely to contain projections of the particle, which can be used to help determine the particle’s three-dimensional structure.

Career Highlights

The patent reflects work at the intersection of image analysis and structural biology. By automating particle picking, the described approach aims to reduce manual effort in processing electron microscopy images.

Collaborations

Kileel’s listed coworkers include Yuehaw Khoo and Ayelet Heimowitz. The patent is associated with Princeton University.

Conclusion

Joseph Kileel’s patent describes a template-free approach to identifying particle projections in electron microscopy images, supporting the broader process of reconstructing three-dimensional particle structures.