Hong Kong, China

Joseph Ki Leuk Lai

This inventor holds 1 USPTO granted patent. Top assignee: Meyer Aluminum Limited. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joseph Ki Leuk Lai. Retrieved from https://idiyas.com/inventor/joseph-ki-leuk-lai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Joseph Ki Leuk Lai: Innovator in Temperature Measurement Technology

Introduction

Joseph Ki Leuk Lai is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of temperature measurement technology. His innovative approach has led to the development of a unique apparatus that enhances the accuracy and efficiency of temperature sensing.

Latest Patents

Joseph Ki Leuk Lai holds a patent for an "Apparatus and method for temperature measurement." This invention features a temperature sensor designed to measure the temperature of both moving and stationary surfaces. The sensor includes a main body portion and a probe head equipped with a thermocouple element. The probe head is coupled to the main body in such a way that it can reciprocate relative to the main body in a pulsed manner, allowing for precise temperature readings.

Career Highlights

Joseph Ki Leuk Lai is currently associated with Meyer Aluminum Limited, where he applies his expertise in temperature measurement technology. His work at the company reflects his commitment to advancing innovative solutions in the industry.

Collaborations

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Conclusion

Joseph Ki Leuk Lai's contributions to temperature measurement technology exemplify the spirit of innovation. His patent demonstrates a practical application that can significantly improve temperature sensing methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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