This inventor holds 1 USPTO granted patent. Top assignee: Itran Corporation. Active years: 1986.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1986
Title: Joseph J Dziezanowski: Innovator in Vision Inspection Systems
Introduction
Joseph J Dziezanowski is a notable inventor based in Weare, NH (US). He has made significant contributions to the field of vision inspection systems. His innovative approach has led to the development of a unique technology that enhances object identification and measurement.
Latest Patents
Dziezanowski holds a patent for a vision inspection system. This system operates with foreground illumination to provide user identification of selected regions of a known object for later comparison to an unknown object. The technology involves processing a gray scale pixel array of each selected region for edges, which are then stored as templates. The system processes gray scale illumination data from larger areas of the unknown object to form gradient maps. By comparing templates to gradient maps, the system can identify and orient the object under test, allowing for various visual attributes and measurements to be determined.
Career Highlights
Dziezanowski's career is marked by his work at Itran Corporation, where he has applied his expertise in vision inspection technology. His innovative contributions have positioned him as a key figure in the development of advanced inspection systems.
Collaborations
Throughout his career, Dziezanowski has collaborated with notable individuals such as Stanley N Lapidus and Seymour Abraham Friedel. These collaborations have further enriched his work and contributed to the advancement of technology in his field.
Conclusion
Joseph J Dziezanowski's work in vision inspection systems exemplifies innovation and dedication to advancing technology. His patent and contributions to Itran Corporation highlight his role as a significant inventor in this specialized area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile