Company Filing History:
Years Active: 2018-2022
Title: Joseph D Stanford: Innovator in Electrical Testing Technology
Introduction
Joseph D Stanford is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of electrical testing technology, holding a total of 3 patents. His work primarily focuses on enhancing the efficiency and effectiveness of electrical die testing.
Latest Patents
One of Joseph's latest patents is for probe pins with etched tips designed for electrical die testing. This innovation involves a prober head that interfaces an E-testing apparatus with a device under test, which may include unpackaged dies. The prober head features an array of conductive pins, each extending outwardly from a first pin end anchored to a substrate. A significant aspect of this design is that at least a partial length of each pin is coated with a hydrophobic monolayer. The conductive pins are made from composite metal wires, which consist of a core metal encased by one or more peripheral metals. Notably, at the tip of the pins, the peripheral metals are recessed from the core metal, enhancing the functionality of the device. In further embodiments, the hydrophobic monolayer is applied to the outer surface of the peripheral metals, while being substantially absent from the surface of the core metal exposed at the tip.
Career Highlights
Joseph D Stanford is currently employed at Intel Corporation, where he continues to innovate and develop new technologies. His work at Intel has positioned him as a key player in the advancement of electrical testing methods.
Collaborations
Throughout his career, Joseph has collaborated with several talented individuals, including Todd P Albertson and David M Craig. These collaborations have contributed to the successful development of his patented technologies.
Conclusion
Joseph D Stanford is a distinguished inventor whose work in electrical testing technology has led to significant advancements in the field. His innovative patents and contributions to Intel Corporation highlight his commitment to improving electrical testing methods.