Joseph B Kruskal

Title: Joseph B. Kruskal: Innovator in Etched Workpiece Inspection

Introduction

Joseph B. Kruskal is a notable inventor based in Maplewood, NJ (US). He is recognized for his contributions to the field of optical inspection, particularly in the method for inspecting etched workpieces. His innovative approach has paved the way for advancements in quality control processes.

Latest Patents

Kruskal holds a patent for a "Method for inspecting etched workpieces." This invention is based on the discovery that by measuring scattered light from an etched workpiece over various orders of diffraction, important characteristics of the workpiece can be correlated with the principal component content of the intensity characteristic. The method involves exposing the workpiece to a beam of coherent light, measuring the intensity of the scattered light, determining the principal component content, and accepting or rejecting the workpiece based on predetermined criteria. This process enhances the reliability of inspections in manufacturing.

Career Highlights

Joseph B. Kruskal has had a distinguished career at AT&T Bell Laboratories, where he has contributed significantly to research and development in optical technologies. His work has not only advanced the field but has also influenced various applications in industry.

Collaborations

Throughout his career, Kruskal has collaborated with esteemed colleagues, including Linda A. Clark and Richard A. Gottscho. These collaborations have fostered innovation and have led to significant advancements in their respective fields.

Conclusion

Joseph B. Kruskal's contributions to the method of inspecting etched workpieces exemplify the impact of innovative thinking in technology. His work continues to influence quality control processes in manufacturing, showcasing the importance of optical inspection methods.