This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Euratom. Active years: 2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008
Title: Innovations of José-Luis Spino in X-ray Diffraction Technology.
Introduction
José-Luis Spino is a notable inventor based in Weingarten, Germany. He has made significant contributions to the field of X-ray diffraction technology. His innovative work focuses on enhancing the capabilities of conventional diffractometers.
Latest Patents
One of his key patents is titled "Micro beam collimator for high resolution XRD investigations with conventional diffractometers." This invention describes a micro collimator designed to compress X-ray beams for use in X-ray diffractometers. The collimator features a channel means that guides the X-ray beams, consisting of a channel entrance portion and a channel exit portion. The primary objective of this invention is to enable the characterization of very small sample regions without the need for large radiation sources, such as synchrotrons. To address this technical challenge, the channel means is formed by two opposite, polished, oblong plates made of or coated with heavyweight metals or materials that possess total reflection properties comparable to those of heavyweight metals. José-Luis Spino holds 1 patent.
Career Highlights
Throughout his career, José-Luis Spino has worked with prominent organizations, including Euratom and the European Atomic Energy Community, represented by the European Commission. His expertise in X-ray technology has positioned him as a valuable contributor to advancements in this field.
Collaborations
José-Luis has collaborated with notable colleagues, including Dimitrios Papaioannou and Hernan Santa Cruz. Their combined efforts have furthered research and development in X-ray diffraction technology.
Conclusion
José-Luis Spino's innovative contributions to X-ray diffraction technology demonstrate his commitment to advancing scientific research. His work continues to influence the field and enhance the capabilities of conventional diffractometers.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile