Shelton, CT, United States of America

Jordan J Pokrinchak

This inventor holds 1 USPTO granted patent. Top assignee: Bar-Ray Products, Inc.. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jordan J Pokrinchak. Retrieved from https://idiyas.com/inventor/jordan-j-pokrinchak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1985

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations by Jordan J Pokrinchak

Introduction

Jordan J Pokrinchak is an accomplished inventor based in Shelton, CT (US). He has made significant contributions to the field of medical imaging through his innovative designs. His work primarily focuses on enhancing the functionality and usability of viewing devices for X-ray films.

Latest Patents

One of his notable patents is a "Viewer for X-ray and like films." This invention is a viewing device that automatically masks areas of the viewing screen that are not in alignment with the film being viewed. The device features a dimension sensing mechanism that aligns a selected mask with the positioned film automatically, based on the sensed dimensions. This innovation improves the efficiency and accuracy of interpreting X-ray images.

Career Highlights

Jordan J Pokrinchak is associated with Bar-Ray Products, Inc., a company known for its advancements in radiographic imaging solutions. His role at the company allows him to apply his inventive skills to develop products that enhance medical imaging technology.

Conclusion

Jordan J Pokrinchak's contributions to the field of medical imaging through his innovative patent demonstrate his commitment to improving healthcare technology. His work continues to impact the way medical professionals interpret X-ray films, ultimately benefiting patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…